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Miniflex 600

The fifth generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The MiniFlex is available in two variations. Operating at 600 watts (X-ray tube), the MiniFlex600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximize flexibility in a benchtop package.

MiniFlex

Benchtop X-ray diffraction (XRD) instrument
The fifth generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The MiniFlex is available in two variations. Operating at 600 watts (X-ray tube), the MiniFlex600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximize flexibility in a benchtop package.

Ideally-suited for today’s fast-paced XRD analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600 W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD
system with an available sample changer. Whether teaching X-ray diffraction at the college and university level, or routine industrial quality assurance, the MiniFlex delivers both performance and value.

Each MiniFlex comes standard with the latest version of PDXL, Rigaku’s full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.

The original MiniFlex, introduced in 1973, was designed to empower a novice user to produce results, with a compact XRD instrument, comparable to those obtainable by a trained diffractionist. The new MiniFlex builds upon the characteristics which have made it popular for many years – including compact size and robust design – enabling installation in a small space with easy-to-use operation and very low cost-of-ownership.

Overview:

  • New fifth generation design
  • Compact, fail-safe radiation enclosure
  • Incident beam variable slit
  • Simple installation and user training
  • Factory aligned goniometer system
  • Laptop computer operation

Measurements:

  • Phase identification
  • Phase quantification
  • Percent (%) crystallinity
  • Crystallite size and strain
  • Lattice parameter refinement
  • Rietveld refinement
  • Molecular structure

Options:

  • 6-position autosampler
  • Graphite monochromator
  • High speed silicon strip detector
  • Air sensitive sample holder
  • Travel case

MiniFlex specifications

Weight 80 kg
Dimensions 560 x 460 x 700 mm
Software

Instrument control : Control & Measurement
Data analysis : PDXL

Generator

Maximum power : 600 W
Tube voltage : 40 kV
Tube current : 15 mA
Shutter : Rotary shutter linked to interlock
X-ray Tube : Cu, Co, Fe, or Cr

Optics

Divergence slit : Fixed or variable
Scattering slit : Fixed
Receiving slit : Fixed
Filter : Kβ foil filter
Monochromator (optional) : Graphite
Soller slit : 5.0° or 2.5°

Goniometer

Type : Vertical
Radius : 150 mm
Scanning range : -3 to 145° (2θ)
Scanning speed : 0.01 to 100°/min (2θ)
Minimum step width : 0.005° (2θ)
Accuracy : ±0.02°

Detector

Scintillation counter : NaI scintillator
D/teX Ultra (Optional) : High speed silicon strip detector

Power Supply

Main body : 100 to 240 VAC – 1φ ±10% – 50/60 Hz ±1% 1.0 kVA
PC: 100 to 240 VAC – 1φ ±10% – 50/60 Hz ±1% 0.7 kVA
Heat exchanger (optional) : 100 to 240 VAC – 1φ ±10% – 50/60Hz ±1% 1.1kVA

Product Overview

University of Southampton in the spotlight

ASC-6 : automatic 6 position sample changer with spinner: Automatic 6-position sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable.

Sample holders: Various sample holder are available to meet the specific needs of particular applications. 

Specimen rotation attachment: The sample rotation stage allows continuous rotation at variable speed of the sample holder to improve particle statistics during powder diffraction measurements. 

 

Graphite monochromator : When used with a scintillation counter, the graphite monochromator optimizes sensitivity by lowering the background level. It improves signal-to-noise by eliminating fluorescence from Mn, Fe, Co, and Ni containing materials. 

Air-sensitive sample holder: An enclosed sample holder is available for users studying materials that might degrade in the presence of oxygen.

D/teX Ultra high speed detector: This 1D silicon strip detector is optionally available for fast, high-resolution scanning. 

BTS 500 high temperature attachment: The high temperature attachment can heat a sample to do in-situ powder diffraction measurements under high temperature conditions from ambient to 500°C.